When system uses 36bit physical address, res.start is 36bit
physical address. But the function of in_be32 returns 32bit
physical address. Then both of them compared each other is
wrong. So by converting the address of res.start into
the right format fixes this issue.
Signed-off-by: Lan Chunhe-B25806 <b25806@freescale.com>
Signed-off-by: Roy Zang <tie-fei.zang@freescale.com>
Reviewed-by: Anton Vorontsov <cbouatmailru@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Move Freescale elbc interrupt from nand driver to elbc driver.
Then all elbc devices can use the interrupt instead of ONLY nand.
For former nand driver, it had the two functions:
1. detecting nand flash partitions;
2. registering elbc interrupt.
Now, second function is removed to fsl_lbc.c.
Signed-off-by: Lan Chunhe-B25806 <b25806@freescale.com>
Signed-off-by: Roy Zang <tie-fei.zang@freescale.com>
Reviewed-by: Anton Vorontsov <cbouatmailru@gmail.com>
Cc: Wood Scott-B07421 <B07421@freescale.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
RAW writes were broken by 782ce79a45
which introduced a check of ops->ooboffs in nand_do_write_ops().
When writing in RAW mode this is called with an ops struct on the stack
of mtdchar.c:mtd_write() which does not initialise ops->ooboffs, so it
is garbage and fails this test.
This test does not make sense if ops->oobbuf is NULL, which it is in the
RAW write path, so include that in the test.
Signed-off-by: Jon Povey <jon.povey@racelogic.co.uk>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
It turns out that pci core now handles these, so this code is redundant
and can even cause bugs
Signed-off-by: Maxim Levitsky <maximlevitsky@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
The bbt structure isn't actually used, just the badblockpos. This lets
the driver correctly handle badblocks with the different OOB layout with
certain sized flashes. Previously, the blocks would all be reported as
bad and be completely unusable.
Signed-off-by: Mike Frysinger <vapier@gentoo.org>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This patch fixes sparse warning for static declaration of variable "use_dma"
drivers/mtd/nand/omap2.c:114:11: warning: symbol 'use_dma' was not declared. Should it be static?
Signed-off-by: G, Manjunath Kondaiah <manjugk@ti.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This patch adds the appropriate conversions to correct the endianness
issues in the MTD driver whenever it accesses the device tree (which is
always big endian).
Signed-off-by: Ian Munsie <imunsie@au1.ibm.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
I used this to check the BBT on flash together with a hack in mtdchar in
order to read bad blocks.
Signed-off-by: Sebastian Andrzej Siewior <bigeasy@linutronix.de>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
it will create an empty BBT table without considering vendor's BBT
information. Vendor's information may be unavailable if the NAND
controller has a different DATA & OOB layout or this information may be
allready purged.
Signed-off-by: Sebastian Andrzej Siewior <bigeasy@linutronix.de>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
The first (sixt) byte in the OOB area contains vendor's bad block
information. During identification of the NAND chip this information is
collected by scanning the complete chip.
The option NAND_USE_FLASH_BBT is used to store this information in a sector so
we don't have to scan the complete flash. Unfortunately the code stores
a marker in order to recognize the BBT in the OOB area. This will fail
if the OOB area is completely used for ECC.
This patch introduces the option NAND_USE_FLASH_BBT_NO_OOB which has to be
used with NAND_USE_FLASH_BBT. It will then store BBT on flash without
touching the OOB area. The BBT format on flash remains same except the
first page starts with the recognition pattern followed by the version byte.
This change was tested in nandsim and it looks good so far :)
Signed-off-by: Sebastian Andrzej Siewior <bigeasy@linutronix.de>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
No code change.
Signed-off-by: Sebastian Andrzej Siewior <bigeasy@linutronix.de>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Signed-off-by: Sebastian Andrzej Siewior <bigeasy@linutronix.de>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Not all the NAND devices have all the information in additional
id bytes.
So add a hook in the nand_chip{} is a good method to calculate the
right value of oobsize, erasesize and so on.
Without the hook,you will get the wrong value, and you have to hack
in the ->scan_bbt() to change the wrong value which make the code
mess.
Signed-off-by: Huang Shijie <shijie8@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This is the same driver submitted by ST Micros SPEAr team but
generalized and tested on the ST-Ericsson U300. It probably
easily works on the NHK8815 too.
Signed-off-by: Vipin Kumar <vipin.kumar@st.com>
Signed-off-by: Rajeev Kumar <rajeev-dlh.kumar@st.com>
Signed-off-by: Shiraz Hashim <shiraz.hashim@st.com>
Signed-off-by: Viresh Kumar <viresh.kumar@st.com>
Signed-off-by: Linus Walleij <linus.walleij@stericsson.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Currently MTD caches the last read NAND page, even if there was an uncorrectable ECC
error. This patch prevents caching in case of uncorrectable ECC errors. The reason
is that we want to allow the user to re-read the NAND page several times. In case of
unstable bits re-trying may help.
Moreover, current behavior is wrong because the first read returns -EBADMSG (correctly)
but the second read succeeds and incorrectly returns 0 (because we read from the cache).
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Fix the build warning:
drivers/mtd/nand/fsl_upm.c: In function 'fun_chip_init':
drivers/mtd/nand/fsl_upm.c:190: warning: format '%x' expects type 'unsigned int', but argument 3 has type 'resource_size_t'
Signed-off-by: Roy Zang <tie-fei.zang@freescale.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Only 3 warnings are left, one is off by one character, but splitting the line
would reduce the readability. One is for a for loop statement, which would also
not improve readability. The last one is a false positive on a test.
Artem: it is much easier to verify patches against nand_base.c with
checkpatch.pl when nand_base.c itself does not have so many
checkpatch.pl warnings.
Signed-off-by: Florian Fainelli <ffainelli@freebox.fr>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Artem: it is much easier to verify patches against nand_base.c with
checkpatch.pl when nand_base.c itself does not have so many
checkpatch.pl warnings.
Signed-off-by: Florian Fainelli <ffainelli@freebox.fr>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Sudhakar found out that 100µs are enough. Sadly, his updated patch was
overlooked and an older version still using 100ms was merged. Fix this.
Reference: http://patchwork.ozlabs.org/patch/59180/
Signed-off-by: Wolfram Sang <w.sang@pengutronix.de>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
In order to reduce the indentation and improve the readability of nand_get_
flash_type, split the ONFI detection logic to its own function. The detection
logic inside nand_flash_detect_onfi is also rewritten to allow for less
indentation.
Signed-off-by: Florian Fainelli <ffainelli@freebox.fr>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This patch adds support for reading NAND device ONFI parameters and use
the ONFI informations to define its geometry. In case the device supports
ONFI, the onfi_version field in struct nand_chip contains the version (BCD)
and the onfi_params structure can be used by drivers to set up timings and
such. We currently only support ONFI 1.0 parameters.
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: Matthieu Castet <matthieu.castet@parrot.com>
Signed-off-by: Maxime Bizon <mbizon@freebox.fr>
Signed-off-by: Florian Fainelli <ffainelli@freebox.fr>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
There are some additions to the detection scheme used by Samsung
MLC NAND. These simple changes to support the 400- and 436-byte OOB
are found in the following data sheet:
Samsung K9GBG08U0M (p.40)
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Add a call to of_node_put in the error handling code following a call to
of_find_compatible_node.
Signed-off-by: Julia Lawall <julia@diku.dk>
Acked-by: Wolfram Sang <w.sang@pengutronix.de>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
For different command need different oob requirement, set the proper
oob length by different cmd.
Signed-off-by: Lei Wen <leiwen@marvell.com>
Acked-by: Eric Miao <eric.y.miao@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
After probe, all info already transfer to driver structure.
There is no need to keep the original flash info.
So that we could safely free the flash info in memory, which may grows
larger when more flash is suported.
Signed-off-by: Lei Wen <leiwen@marvell.com>
Signed-off-by: Haojian Zhuang <haojian.zhuang@marvell.com>
Acked-by: Eric Miao <eric.y.miao@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
We certainly don't need to send read id command times by times, since
we already know what the id is after the first read id...
So create a default timing which could ensure it would successfully read
id out all supported chip. Then follow the build-in table to reconfigure
the timing.
Signed-off-by: Lei Wen <leiwen@marvell.com>
Signed-off-by: Haojian Zhuang <haojian.zhuang@marvell.com>
Acked-by: Eric Miao <eric.y.miao@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Adding a new flash definition would need less code.
Keep the platform passing flash definition method.
If one flash is both defined in platform data and builtin table,
driver would select the one from platform data first.
By this way, platform could select the timing most suit for itself,
not need to follow the common settings.
Signed-off-by: Lei Wen <leiwen@marvell.com>
Signed-off-by: Haojian Zhuang <haojian.zhuang@marvell.com>
Acked-by: Eric Miao <eric.y.miao@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Toshiba does not use ONFI for their NAND flash. So we have to continue
to add new IDs used by Toshiba devices as well as heuristic detection
for scanning the 2nd page for a BBM. This is a relatively harmless
start at supporting many of them.
These chips mostly follow the same ID fields of previous generations,
but there is a need for a tweak.
These chips introduce a strange 576 byte OOB (that's 36 bytes per
512 bytes of page). In the preliminary data, Toshiba has not
defined exactly how their ID strings should decode. In the future,
a new tweak must be added.
Data is taken from, among others, Toshiba TC58TxG4S2FBAxx
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
struct nand_ecclayout is too small for many new chips; OOB regions can be as
large as 448 bytes and may increase more in the future. Thus, copying that
struct to user-space with the ECCGETLAYOUT ioctl is not a good idea; the ioctl
would have to be updated every time there's a change to the current largest
size.
Instead, the old nand_ecclayout is renamed to nand_ecclayout_user and a
new struct nand_ecclayout is created that can accomodate larger sizes and
expand without affecting the user-space. struct nand_ecclayout can still
be used in board drivers without modification -- at least for now.
A new function is provided to convert from the new to the old in order to
allow the deprecated ioctl to continue to work with truncated data. Perhaps
the ioctl, the conversion process, and the struct nand_ecclayout_user can be
removed altogether in the future.
Note: There are comments in nand/davinci_nand.c::nand_davinci_probe()
regarding this issue; this driver (and maybe others) can be updated to
account for extra space. All kernel drivers can use the expanded
nand_ecclayout as a drop-in replacement and ignore its benefits.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Some Spansion chips have a method for determining eraseblock size that
is incompatible with similar ID chips of other sizes. This implements
some heuristic detection of these differences.
This patch checks for a 5-byte ID with trailing zeros as well as a
512-byte page size to ensure that chips are not misdetected as the
S30MLxxxP ORNAND series.
[Tweaked by Artem a bit]
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Drivers may (and do) return negative errno values other than -1 from the
ecc.correct callback.
Signed-off-by: Baruch Siach <baruch@tkos.co.il>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Signed-off-by: Mark F. Brown <mark.brown314@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This patch initializes the pages per block field in CONFIG1 for
v2 controllers. It also sets the FP_INT field. This is the last
field not correctly initialized, so we can switch from
read/modify/write the CONFIG1 reg to just write the correct
value.
Signed-off-by: Sascha Hauer <s.hauer@pengutronix.de>
Acked-by: John Ogness <john.ogness@linutronix.de>
Tested-by: John Ogness <john.ogness@linutronix.de>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Since info->mtd isn't dynamically allocated, we shouldn't attempt to
kfree() it. Otherwise we get random fun corruption when unloading
the driver built as a module.
Signed-off-by: Mike Frysinger <vapier@gentoo.org>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Seems some patches got out sync when being merged. The Blackfin NFC
driver was updated to use nand_scan_ident(), but it missed the change
where nand_scan_ident() now takes 3 arguments. So update this driver
to fix build failures.
Signed-off-by: Mike Frysinger <vapier@gentoo.org>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This patch avoids byte access to the NFC buffer. Byte access to the
NFC is not allowed.
The patch is against linux-next 20100618.
Signed-off-by: John Ogness <john.ogness@linutronix.de>
Signed-off-by: Sascha Hauer <s.hauer@pengutronix.de>
Tested-by: John Ogness <john.ogness@linutronix.de>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Apparently, the check for a 6-byte ID string introduced by commit
426c457a32 ("mtd: nand: extend NAND flash
detection to new MLC chips") is NOT sufficient to determine whether or
not a Samsung chip uses their new MLC detection scheme or the old,
standard scheme. This adds a condition to check cell type.
Signed-off-by: Tilman Sauerbeck <tilman@code-monkey.de>
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Cc: stable@kernel.org
Commit c7b28e25cb ("mtd: nand: refactor BB
marker detection") caused a regression in detection of factory-set bad
block markers, especially for certain small-page NAND. This fix removes
some unneeded constraints on using NAND_SMALL_BADBLOCK_POS, making the
detection code more correct.
This regression can be seen, for example, in Hynix HY27US081G1M and
similar.
Signed-off-by: Brian Norris <norris@broadcom.com>
Tested-by: Michael Guntsche <mike@it-loops.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Test on a PXA310 platform with Samsung K9F2G08X0B NAND flash,
with tCH=5 and clk is 156MHz, ns2cycle(5, 156000000) returns -1.
ns2cycle returns negtive value will break NDTR0_tXX macros.
After checking the commit log, I found the problem is introduced by
commit 5b0d4d7c8a
"[MTD] [NAND] pxa3xx: convert from ns to clock ticks more accurately"
To get num of clock cycles, we use below equation:
num of clock cycles = time (ns) / one clock cycle (ns) + 1
We need to add 1 cycle here because integer division will truncate the result.
It is possible the developers set the Min values in SPEC for timing settings.
Thus the truncate may cause problem, and it is safe to add an extra cycle here.
The various fields in NDTR{01} are in units of clock ticks minus one,
thus we should subtract 1 cycle then.
Thus the correct equation should be:
num of clock cycles = time (ns) / one clock cycle (ns) + 1 - 1
= time (ns) / one clock cycle (ns)
Signed-off-by: Axel Lin <axel.lin@gmail.com>
Signed-off-by: Lei Wen <leiwen@marvell.com>
Acked-by: Eric Miao <eric.y.miao@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Cc: stable@kernel.org
* git://git.infradead.org/mtd-2.6:
mtd/nand_ids: Fix buswidth
mtd/m25p80: fix test for end of loop
mtd/m25p80: retlen is never NULL
MIPS: Fix gen_nand probe structures contents
gen_nand: Test if nr_chips field is valid
BFIN: Fix gen_nand probe structures contents
nand/denali: move all hardware initialization work to denali_hw_init
nand/denali: Add a page check in denali_read_page & denali_read_page_raw
nand/denali: use cpu_relax() while waiting for hardware interrupt
nand/denali: change read_status function method
nand/denali: Fixed check patch warnings
ARM: Fix gen_nand probe structures contents
mtd/nand_base: fix kernel-doc warnings & typos
nand/denali: use dev_xx debug function to replace nand_dbg_print and some printk
nand/denali: Fixed handle ECC error bugs
nand/denali: use iowrite32() to replace denali_write32()
nand/denali: Fixed probe function bugs
The buswidth for chips of ID 0xD7 is x8, not x16.
This was my previous typo.
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
All hardware initialization will be done in denali_hw_init before
irq handler registered
Change mtd name from "DENALI NAND" to be "denali-nand" since whitespace in
name can cause problems if we use cmdlinepart
Signed-off-by: Chuanxiao Dong <chuanxiao.dong@intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
In mtd->write, Denali controller will use MODE_11 mode to read
NAND flash status, then return back to MODE_1O mode to do page
write.
Here comes a bug for this kind of using, sometimes controller will
not write data to NAND and just return a good interrupt to tell
driver writing work is done. The data in this page is all 0xff and
this page can not be written again. The reason is unknow.
So read Denali controller register WRITE_PROTECT to get NAND status
instead.
Signed-off-by: Chuanxiao Dong <chuanxiao.dong@intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
waring: no space for starting a line
Signed-off-by: Chuanxiao Dong <chuanxiao.dong@intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
