android_kernel_motorola_sm6225/drivers/mtd/tests
Roger Quadros afc0ea1b8e mtd: mtd_oobtest: add bitflip_limit parameter
It is common for NAND devices to have bitflip errors.
Add a bitflip_limit parameter to specify how many bitflips per
page we can tolerate without flagging an error.
By default zero bitflips are tolerated.

Signed-off-by: Roger Quadros <rogerq@ti.com>
Signed-off-by: Sekhar Nori <nsekhar@ti.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
2014-11-19 23:25:49 -08:00
..
Makefile mtd: tests: rename sources in order to link a helper object 2013-08-30 21:34:06 +01:00
mtd_nandecctest.c mtd: tests: mtd_nandecctest: Use IS_ENABLED() macro 2014-01-03 11:22:21 -08:00
mtd_test.c mtd: tests: fix integer overflow issues 2014-08-19 11:53:08 -07:00
mtd_test.h mtd: tests: introduce helper functions 2013-08-30 21:28:22 +01:00
nandbiterrs.c mtd: tests: fix integer overflow issues 2014-08-19 11:53:08 -07:00
oobtest.c mtd: mtd_oobtest: add bitflip_limit parameter 2014-11-19 23:25:49 -08:00
pagetest.c mtd: tests: fix integer overflow issues 2014-08-19 11:53:08 -07:00
readtest.c mtd: tests: fix integer overflow issues 2014-08-19 11:53:08 -07:00
speedtest.c mtd: tests: fix integer overflow issues 2014-08-19 11:53:08 -07:00
stresstest.c mtd: tests: incorporate error message for mtdtest_write() 2013-08-30 21:36:06 +01:00
subpagetest.c mtd: tests: fix integer overflow issues 2014-08-19 11:53:08 -07:00
torturetest.c mtd: mtd_torturetest: use mtd_test helpers 2013-08-30 21:34:24 +01:00