android_kernel_motorola_sm6225/drivers/mtd/tests/mtd_stresstest.c
Wolfram Sang 7406060e29 mtd: tests: don't use mtd0 as a default
mtd tests may erase the mtd device, so force the user to specify which
mtd device to test by using the module parameter. Disable the default
(using mtd0) since this may destroy a vital part of the flash if the
module is inserted accidently or carelessly.

Reported-by: Roland Kletzing <devzero@web.de>
Signed-off-by: Wolfram Sang <w.sang@pengutronix.de>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@intel.com>
2011-10-30 14:31:04 +02:00

341 lines
7.5 KiB
C

/*
* Copyright (C) 2006-2008 Nokia Corporation
*
* This program is free software; you can redistribute it and/or modify it
* under the terms of the GNU General Public License version 2 as published by
* the Free Software Foundation.
*
* This program is distributed in the hope that it will be useful, but WITHOUT
* ANY WARRANTY; without even the implied warranty of MERCHANTABILITY or
* FITNESS FOR A PARTICULAR PURPOSE. See the GNU General Public License for
* more details.
*
* You should have received a copy of the GNU General Public License along with
* this program; see the file COPYING. If not, write to the Free Software
* Foundation, 59 Temple Place - Suite 330, Boston, MA 02111-1307, USA.
*
* Test random reads, writes and erases on MTD device.
*
* Author: Adrian Hunter <ext-adrian.hunter@nokia.com>
*/
#include <linux/init.h>
#include <linux/module.h>
#include <linux/moduleparam.h>
#include <linux/err.h>
#include <linux/mtd/mtd.h>
#include <linux/slab.h>
#include <linux/sched.h>
#include <linux/vmalloc.h>
#define PRINT_PREF KERN_INFO "mtd_stresstest: "
static int dev = -EINVAL;
module_param(dev, int, S_IRUGO);
MODULE_PARM_DESC(dev, "MTD device number to use");
static int count = 10000;
module_param(count, int, S_IRUGO);
MODULE_PARM_DESC(count, "Number of operations to do (default is 10000)");
static struct mtd_info *mtd;
static unsigned char *writebuf;
static unsigned char *readbuf;
static unsigned char *bbt;
static int *offsets;
static int pgsize;
static int bufsize;
static int ebcnt;
static int pgcnt;
static unsigned long next = 1;
static inline unsigned int simple_rand(void)
{
next = next * 1103515245 + 12345;
return (unsigned int)((next / 65536) % 32768);
}
static inline void simple_srand(unsigned long seed)
{
next = seed;
}
static int rand_eb(void)
{
int eb;
again:
if (ebcnt < 32768)
eb = simple_rand();
else
eb = (simple_rand() << 15) | simple_rand();
/* Read or write up 2 eraseblocks at a time - hence 'ebcnt - 1' */
eb %= (ebcnt - 1);
if (bbt[eb])
goto again;
return eb;
}
static int rand_offs(void)
{
int offs;
if (bufsize < 32768)
offs = simple_rand();
else
offs = (simple_rand() << 15) | simple_rand();
offs %= bufsize;
return offs;
}
static int rand_len(int offs)
{
int len;
if (bufsize < 32768)
len = simple_rand();
else
len = (simple_rand() << 15) | simple_rand();
len %= (bufsize - offs);
return len;
}
static int erase_eraseblock(int ebnum)
{
int err;
struct erase_info ei;
loff_t addr = ebnum * mtd->erasesize;
memset(&ei, 0, sizeof(struct erase_info));
ei.mtd = mtd;
ei.addr = addr;
ei.len = mtd->erasesize;
err = mtd->erase(mtd, &ei);
if (unlikely(err)) {
printk(PRINT_PREF "error %d while erasing EB %d\n", err, ebnum);
return err;
}
if (unlikely(ei.state == MTD_ERASE_FAILED)) {
printk(PRINT_PREF "some erase error occurred at EB %d\n",
ebnum);
return -EIO;
}
return 0;
}
static int is_block_bad(int ebnum)
{
loff_t addr = ebnum * mtd->erasesize;
int ret;
ret = mtd->block_isbad(mtd, addr);
if (ret)
printk(PRINT_PREF "block %d is bad\n", ebnum);
return ret;
}
static int do_read(void)
{
size_t read = 0;
int eb = rand_eb();
int offs = rand_offs();
int len = rand_len(offs), err;
loff_t addr;
if (bbt[eb + 1]) {
if (offs >= mtd->erasesize)
offs -= mtd->erasesize;
if (offs + len > mtd->erasesize)
len = mtd->erasesize - offs;
}
addr = eb * mtd->erasesize + offs;
err = mtd->read(mtd, addr, len, &read, readbuf);
if (mtd_is_bitflip(err))
err = 0;
if (unlikely(err || read != len)) {
printk(PRINT_PREF "error: read failed at 0x%llx\n",
(long long)addr);
if (!err)
err = -EINVAL;
return err;
}
return 0;
}
static int do_write(void)
{
int eb = rand_eb(), offs, err, len;
size_t written = 0;
loff_t addr;
offs = offsets[eb];
if (offs >= mtd->erasesize) {
err = erase_eraseblock(eb);
if (err)
return err;
offs = offsets[eb] = 0;
}
len = rand_len(offs);
len = ((len + pgsize - 1) / pgsize) * pgsize;
if (offs + len > mtd->erasesize) {
if (bbt[eb + 1])
len = mtd->erasesize - offs;
else {
err = erase_eraseblock(eb + 1);
if (err)
return err;
offsets[eb + 1] = 0;
}
}
addr = eb * mtd->erasesize + offs;
err = mtd->write(mtd, addr, len, &written, writebuf);
if (unlikely(err || written != len)) {
printk(PRINT_PREF "error: write failed at 0x%llx\n",
(long long)addr);
if (!err)
err = -EINVAL;
return err;
}
offs += len;
while (offs > mtd->erasesize) {
offsets[eb++] = mtd->erasesize;
offs -= mtd->erasesize;
}
offsets[eb] = offs;
return 0;
}
static int do_operation(void)
{
if (simple_rand() & 1)
return do_read();
else
return do_write();
}
static int scan_for_bad_eraseblocks(void)
{
int i, bad = 0;
bbt = kzalloc(ebcnt, GFP_KERNEL);
if (!bbt) {
printk(PRINT_PREF "error: cannot allocate memory\n");
return -ENOMEM;
}
/* NOR flash does not implement block_isbad */
if (mtd->block_isbad == NULL)
return 0;
printk(PRINT_PREF "scanning for bad eraseblocks\n");
for (i = 0; i < ebcnt; ++i) {
bbt[i] = is_block_bad(i) ? 1 : 0;
if (bbt[i])
bad += 1;
cond_resched();
}
printk(PRINT_PREF "scanned %d eraseblocks, %d are bad\n", i, bad);
return 0;
}
static int __init mtd_stresstest_init(void)
{
int err;
int i, op;
uint64_t tmp;
printk(KERN_INFO "\n");
printk(KERN_INFO "=================================================\n");
if (dev < 0) {
printk(PRINT_PREF "Please specify a valid mtd-device via module paramter\n");
printk(KERN_CRIT "CAREFUL: This test wipes all data on the specified MTD device!\n");
return -EINVAL;
}
printk(PRINT_PREF "MTD device: %d\n", dev);
mtd = get_mtd_device(NULL, dev);
if (IS_ERR(mtd)) {
err = PTR_ERR(mtd);
printk(PRINT_PREF "error: cannot get MTD device\n");
return err;
}
if (mtd->writesize == 1) {
printk(PRINT_PREF "not NAND flash, assume page size is 512 "
"bytes.\n");
pgsize = 512;
} else
pgsize = mtd->writesize;
tmp = mtd->size;
do_div(tmp, mtd->erasesize);
ebcnt = tmp;
pgcnt = mtd->erasesize / pgsize;
printk(PRINT_PREF "MTD device size %llu, eraseblock size %u, "
"page size %u, count of eraseblocks %u, pages per "
"eraseblock %u, OOB size %u\n",
(unsigned long long)mtd->size, mtd->erasesize,
pgsize, ebcnt, pgcnt, mtd->oobsize);
/* Read or write up 2 eraseblocks at a time */
bufsize = mtd->erasesize * 2;
err = -ENOMEM;
readbuf = vmalloc(bufsize);
writebuf = vmalloc(bufsize);
offsets = kmalloc(ebcnt * sizeof(int), GFP_KERNEL);
if (!readbuf || !writebuf || !offsets) {
printk(PRINT_PREF "error: cannot allocate memory\n");
goto out;
}
for (i = 0; i < ebcnt; i++)
offsets[i] = mtd->erasesize;
simple_srand(current->pid);
for (i = 0; i < bufsize; i++)
writebuf[i] = simple_rand();
err = scan_for_bad_eraseblocks();
if (err)
goto out;
/* Do operations */
printk(PRINT_PREF "doing operations\n");
for (op = 0; op < count; op++) {
if ((op & 1023) == 0)
printk(PRINT_PREF "%d operations done\n", op);
err = do_operation();
if (err)
goto out;
cond_resched();
}
printk(PRINT_PREF "finished, %d operations done\n", op);
out:
kfree(offsets);
kfree(bbt);
vfree(writebuf);
vfree(readbuf);
put_mtd_device(mtd);
if (err)
printk(PRINT_PREF "error %d occurred\n", err);
printk(KERN_INFO "=================================================\n");
return err;
}
module_init(mtd_stresstest_init);
static void __exit mtd_stresstest_exit(void)
{
return;
}
module_exit(mtd_stresstest_exit);
MODULE_DESCRIPTION("Stress test module");
MODULE_AUTHOR("Adrian Hunter");
MODULE_LICENSE("GPL");